Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate
2006-02-14
2006-02-14
Lamarre, Guy (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Replacement of memory spare location, portion, or segment
C365S200000
Reexamination Certificate
active
07000156
ABSTRACT:
A defect information storing device includes two tables for storing information on defective points of a semiconductor device. The first table stores column addresses and number of defective points existing at this column address for (r×c+c) lines. The second table stores row addresses, number of defective points existing at this row address, and column identifiers indicating the storage place of the column address of the defective point in the first table for (r×c+r) lines.
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Fujiwara Yoshinori
Shimada Yutaka
Britt Cynthia
Lamarre Guy
Leydig , Voit & Mayer, Ltd.
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