Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1994-09-23
1997-07-01
Tran, Minh-Loan
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
257209, 257435, 430313, 430314, H01L 2358
Patent
active
056441444
ABSTRACT:
A device and method is provided for programming an output logic level based on one or more revisions to mask layers utilized for forming an integrated circuit. The programmed logic level is represented as a logic value and is output from a device embodied within the integrated circuit formed from the mask layers. Each revision of mask layers is represented as a binary value at bit locations within a revision code output from the present system. The device and method hereof is used to program the system in accordance with an infinite numbers of mask layers and revisions to those mask layers. The programmed output from the system is represented as a revision code of numerous bits output through a pin location extending from the outer surface of a package surrounding the integrated circuit. Ready access to the pin location allows an end user to access and determine a version of integrated circuit product embodied within a sealed package, without opening the package and destroying the enclosed product.
REFERENCES:
patent: 5260597 (1993-11-01), Orbach et al.
patent: 5594273 (1997-01-01), Dasse et al.
Advanced Micro Devices , Inc.
Daffer Kevin L.
Tran Minh-Loan
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