Device and method for creating a signature

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S724000, C714S727000, C714S728000, C714S734000, C714S741000

Reexamination Certificate

active

07461311

ABSTRACT:
A device and a method for forming a signature, a predefined number of shift registers being provided, to which input data to be tested is applied bit-by-bit and in parallel as successive data words and which serially shift the input data forward in a predefinable cycle, a signature being formed in the shift registers after a certain number of data words and cycles, a code generator which generates at least one additional bit position in at least one additional shift register from each data word in the signature also being provided.

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Biswas, “Design of UED-AUED Codes from Berger's AUED Code”, IEEE VLSI Design, 1997, Jan. 1997, pp. 364-369.
Built-In Test for VLSI: Pseudorandom Techniques by Paul H. Bardell, William H. McAnney and Jacob Savir; pp. 124 et seq.
A Linear Code-Preserving Signature Analyzer COPMISR; Hlawiczka et al; VLSI Test Symposium, 1997-15thIEEE Monterey, CA USA Apr. 27-May 1, 1997.; pp. 350-355.
Low Cost BIST for EDAC Circuits; Badura et al; Test Symposium, 1997 (ATS '97), Proceedings, Sixth Asian Akita, Japan Nov. 17-19, 1997; pp. 410-415.
Utilization of On-Line (Concurrent) Checkers During Built-In-Self-Test and Vice Versa; Gupta et al.; IEEE Transactions on Computers; Jan. 1, 1996; pp. 63-73.
Design of t-UED/AUED Codes from Berger's AUED Code; Biswas et al.; VLSI Design, 1997, Proceedings, Tenth International Conference on Hyderabad; Jan. 4-7, 1997; pp. 364-369.

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