Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-09-05
2006-09-05
Whitmore, Stacy A (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C324S754090, C324S763010
Reexamination Certificate
active
07103856
ABSTRACT:
A system and method for determining locations of maximum deflection of a printed circuit board (PCB) under test conditioned by boundary and loading conditions of the PCB, first vertical force magnitudes at associated first vertical force locations to be applied to the PCB by a tester fixture in a first direction, and second vertical force magnitudes at associated second vertical force locations to be applied to the PCB by the tester fixture in a second direction. Fixture components may be added to the design to the fixture design and the method iteratively executed until the magnitude of the maximum deflection is less than or equal to a predetermined maximum deflection magnitude.
REFERENCES:
patent: 6667628 (2003-12-01), Ahrikencheikh et al.
patent: 6839883 (2005-01-01), Ahrikencheikh
patent: 2003/0184329 (2003-10-01), Ahrikencheikh et al.
Agilent Technologie,s Inc.
Whitmore Stacy A
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