4. Error detection/correction and fault detection/recovery
  5. Data processing system error or fault handling
  6. Reliability and availability

Cherif Ahrikencheikh

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Determining points of maximum deflection of a printed...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Determining support locations in a wireless fixture of a...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Determining via placement in the printed circuit board of a...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for board model correction

Data processing: measuring – calibrating – or testing – Calibration or correction system
Reexamination Certificate

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Method and apparatus for correcting for detector...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2014688

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