Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-05-08
2007-05-08
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10704234
ABSTRACT:
In one embodiment, a method for determining one or more reachable states in a circuit using distributed computing and one or more partitioned data structures includes, at a first one of multiple computing systems, receiving a first partition of a circuit. The first partition corresponds to a first binary decision diagram (BDD) having a first density. The method includes performing a first reachability analysis on the first partition using the first BDD until a fixed point in the first partition has been reached and, if, during the first reachability analysis, the size of the first BDD exceeds a threshold, discarding the first BDD. The method includes communicating with at least one second one of the multiple computing systems. The second one of the multiple computing systems has received a second partition of the circuit. The second one of the multiple computing systems has performed a second reachability analysis on the second BDD without discarding the second BDD.
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Iyer Subramanian K.
Jain Jawahar
Kojima Yoshihisa
Narayan Amit
Ogawa Takaya
Baker & Botts L.L.P.
Do Thuan
Fujitsu Limited
Levin Naum B.
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