Detecting apparatus and device manufacturing method

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S441110, C250S397000

Reexamination Certificate

active

07449691

ABSTRACT:
A detecting apparatus for detecting a fine geometry on a surface of a sample, wherein an irradiation beam is irradiated against the sample placed in a different environment different from an atmosphere and a secondary radiation emanated from the sample is detected by a sensor, and wherein the sensor is disposed at an inside of the different environment, a processing device to process detection signals from the sensor is disposed at an outside of the different environment, and a transmission means transmits detection signals from the sensor to the processing device.

REFERENCES:
patent: 4795977 (1989-01-01), Frost et al.
patent: 5434901 (1995-07-01), Nagai et al.
patent: 5808312 (1998-09-01), Fukuda
patent: 5868664 (1999-02-01), Speier et al.
patent: 6038018 (2000-03-01), Yamazaki et al.
patent: 6067153 (2000-05-01), Mizuno
patent: 6184526 (2001-02-01), Kohama et al.
patent: 6465781 (2002-10-01), Nishimura et al.
patent: 6655983 (2003-12-01), Ishikawa et al.
patent: 6765609 (2004-07-01), Kinoshita
patent: 0 452 114 (1991-10-01), None
patent: 2000-113848 (2000-04-01), None
European Patent Office Communication including European Search Report for corresponding European Patent Application 02020243.8 dated Apr. 10, 2003.
D3 Miroslav Horacek: “Detection of the Angular Distribution of the Signal Electrons in VLESEM” Journal of Computer Assisted Microscopy, vol. 10, No. 1, pp. 23-32.
Communicatin from the European Patent Office dated Apr. 25, 2008 for the corresponding EP APplication No. 02 020 243.8.
Office Action dated Jul. 11, 2008 issued in corresponding Korean application No. 2002-54248.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Detecting apparatus and device manufacturing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Detecting apparatus and device manufacturing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Detecting apparatus and device manufacturing method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4046533

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.