Designing an integrated circuit to improve yield using a...

Details Designing an integrated circuit to improve yield using a... Designing an integrated circuit to improve yield using a...

2003-11-17

2009-02-03

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07487474

ABSTRACT:
An integrated circuit is designed to improve yield when manufacturing the integrated circuit, by obtaining a design element from a set of design elements used in designing integrated circuits. A variant design element is created based on the obtained design element, where a feature of the obtained design element is modified to create the variant design element. A yield to area ratio for the variant design element is determined. If the yield to area ratio of the variant design element is greater than a yield to area ratio of the obtained design element, the variant design element is retained to be used in designing the integrated circuit.

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Allan, G., (May 2002) “Yield/Reliability Enhancement Using Automated Layout Modifications,” 2002 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, Boston, MA, pp. 252-261.

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