Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate
Reexamination Certificate
2003-09-30
2008-12-23
Nguyen, Tuan H (Department: 2813)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
C438S481000
Reexamination Certificate
active
07468311
ABSTRACT:
A method is provided for depositing a silicon-containing film on a substrate by a low pressure deposition process in a processing system. A silicon-containing film can be formed on a substrate by providing a substrate in a process chamber of a processing system, heating the substrate, and exposing a hexachlorodisilane (HCD) process gas to the substrate. The method can selectively deposit an epitaxial silicon-containing film on a silicon surface of a substrate or, alternately, non-selectively deposit a silicon-containing film on a substrate. A processing tool containing a processing system for forming a silicon-containing film on s substrate using a HCD process gas is provided.
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Dip Anthony
Leith Allen John
Oh Seungho
Nguyen Tuan H
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tokyo Electron Limited
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