Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging
Patent
1980-03-03
1982-04-13
Newsome, John H.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Electron beam imaging
346107R, 346158, 427 38, 427 531, 427 541, 430298, 430 31, 427 431, B05D 306, H05K 318
Patent
active
043248543
ABSTRACT:
A thin film of material such as metal is deposited on the surface of a substrate by placing a substrate (22) into a chamber (10) containing holder (12) cooled by heat exchanger 18. A beam (56) of U.V. light from the illumination source (42) is projected through monochromator (43), mask (46) and lens (16) onto a selected area (58) of the substrate at an energy level exceeding the photoemission threshold of the surface. A slow electron (60) is ejected from the surface into the capture zone (62). A compound AB such as iron pentacarbonyl from supply (30) is leaked into the chamber (10), enters the capture zone (60) to form a highly reactive deposition fragment A.sup.- which attaches to the surface and a dissociation fragment which is evacuated through outlet (14). The deposited fragment may further dissociate to form metal deposit.
REFERENCES:
patent: 3386823 (1968-06-01), Keller et al.
patent: 3551213 (1970-12-01), Boyle
patent: 3660087 (1972-05-01), Kaspaul et al.
Beauchamp Jesse L.
George Patricia M.
California Institute of Technology
Jacobs Marvin E.
Newsome John H.
LandOfFree
Deposition of metal films and clusters by reactions of compounds does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Deposition of metal films and clusters by reactions of compounds, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Deposition of metal films and clusters by reactions of compounds will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1417766