Deposition of metal films and clusters by reactions of compounds

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging

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346107R, 346158, 427 38, 427 531, 427 541, 430298, 430 31, 427 431, B05D 306, H05K 318

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043248543

ABSTRACT:
A thin film of material such as metal is deposited on the surface of a substrate by placing a substrate (22) into a chamber (10) containing holder (12) cooled by heat exchanger 18. A beam (56) of U.V. light from the illumination source (42) is projected through monochromator (43), mask (46) and lens (16) onto a selected area (58) of the substrate at an energy level exceeding the photoemission threshold of the surface. A slow electron (60) is ejected from the surface into the capture zone (62). A compound AB such as iron pentacarbonyl from supply (30) is leaked into the chamber (10), enters the capture zone (60) to form a highly reactive deposition fragment A.sup.- which attaches to the surface and a dissociation fragment which is evacuated through outlet (14). The deposited fragment may further dissociate to form metal deposit.

REFERENCES:
patent: 3386823 (1968-06-01), Keller et al.
patent: 3551213 (1970-12-01), Boyle
patent: 3660087 (1972-05-01), Kaspaul et al.

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