Deposition of high quality conformal silicon oxide thin films on

Coating processes – Direct application of electrical – magnetic – wave – or... – Plasma

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427578, 427573, 427574, 427109, B05D 306, C23C 1640

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active

058611975

ABSTRACT:
A plasma enhanced chemical vapor deposition process for depositing conformal silicon oxide thin films useful to make thin film transistors which have stable electrical properties and low charge centers onto a substrate comprising flowing a precursor gas mixture of silane and nitrous oxide, the latter at a high rate, at a pressure of at least about 0.8 torr and a temperature of from about 250.degree. to 350.degree. C. The effective volume of the reaction region between the gas manifold inlet and the substrate during processing is kept small.

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patent: 4987856 (1991-01-01), Hey et al.
Batey, et al., "Low temperature deposition of high quality silicon dioxide by plasma enhanced chemical vapor deposition", J. Appl. Phys. 60 (9), Nov. 1986, pp. 3136-3145.
Pande, et al., High mobility n-channel metal oxide semiconductor field effect transistors based on SiO2--InP interface, J. Appl. Phys. 55 (8), Apr. 1984, pp. 3109-3114.

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