Deposition methods

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Multiple layers

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S685000, C438S758000, C257SE21160

Reexamination Certificate

active

07407892

ABSTRACT:
The invention includes deposition methods and apparatuses which can be utilized during atomic layer deposition or chemical vapor deposition. A heated surface is provided between a stack of semiconductor substrates and a precursor inlet, and configured so that problematic side reactions occur proximate the heated surface rather than proximate the semiconductor substrates. The precursor inlet can be one of a plurality of precursor inlets, and the heated surface can be one of a plurality of heated surfaces.

REFERENCES:
patent: 5020475 (1991-06-01), Crabb et al.
patent: 6042652 (2000-03-01), Hyun et al.
patent: 7220312 (2007-05-01), Doan et al.
patent: 2002/0147611 (2002-10-01), Bondeslam et al.
patent: 2002/0157611 (2002-10-01), Bondestam et al.
patent: 2002/0162506 (2002-11-01), Sneh et al.
patent: 2002/0173164 (2002-11-01), Raffin et al.
patent: 2003/0049372 (2003-03-01), Cook et al.
patent: 2003/0060030 (2003-03-01), Lee et al.
patent: 2004/0152304 (2004-08-01), Sarigiannis
patent: WO 2004/015742 (2004-02-01), None
patent: PCT/US2006/017063 (2006-05-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Deposition methods does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Deposition methods, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Deposition methods will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4011104

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.