Active solid-state devices (e.g. – transistors – solid-state diode – With means to increase breakdown voltage threshold
Patent
1996-07-16
1998-09-01
Jackson, Jerome
Active solid-state devices (e.g., transistors, solid-state diode
With means to increase breakdown voltage threshold
257 77, 257655, 257657, H01L 2358, H01L 29861
Patent
active
058018360
ABSTRACT:
A semiconductor component comprises a pn junction having a first conductivity type layer and a second conductivity type layer, both being doped layers of silicon carbide (SiC), the first conductivity type layer being lower doped and being provided with a depletion region stopper (DRS) located outside the pn junction, the DRS having stepwise or continuously increasing effective sheet charge density of the first conducting type in a radial direction towards the outer edge of the semiconductor component.
REFERENCES:
patent: 4648174 (1987-03-01), Temple et al.
patent: 4750025 (1988-06-01), Chen et al.
patent: 4750028 (1988-06-01), Ludikhuize
patent: 5041896 (1991-08-01), Temple et al.
patent: 5093693 (1992-03-01), Abbas et al.
patent: 5113237 (1992-05-01), Stengl
patent: 5155574 (1992-10-01), Yamaguchi
patent: 5345101 (1994-09-01), Tu
Kazuya, Amplification-Type Solid Image Pickup Element and its Manufacturing Method, Patent Abstracts of Japan, vol. 96, No. 5 Abstract of JP 8-18024 A (Sony Corp.), 1996.
Bakowski Mietek
Gustafsson Ulf
ABB Research Ltd.
Guay John
Jackson Jerome
LandOfFree
Depletion region stopper for PN junction in silicon carbide does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Depletion region stopper for PN junction in silicon carbide, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Depletion region stopper for PN junction in silicon carbide will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-275632