Dense trench MOSFET with decreased etch sensitivity to...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S329000

Reexamination Certificate

active

07436021

ABSTRACT:
A power MOSFET100has a source metal112that contacts silicided source regions114through vias160etched in an insulating layer200. The silicide layer225provides for a relatively small but highly conductive contact and thus reduces RDSON. The insulating material may be any suitable material including and not limited to one or a combination of materials such as BPSG, PSG, silicon dioxide and silicon nitride. The insulating layer is relatively thin and does not extend deeply into the gate trench.

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patent: 6252277 (2001-06-01), Chan et al.
patent: 6262439 (2001-07-01), Takeuchi et al.
patent: 2001/0048131 (2001-12-01), Hurkx et al.
patent: 1041638 (2000-10-01), None

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