Radiant energy – Inspection of solids or liquids by charged particles – Methods
Reexamination Certificate
2006-02-21
2006-02-21
Wells, Nikita (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Methods
C250S306000, C250S42300F
Reexamination Certificate
active
07002149
ABSTRACT:
Disclosed is a measuring apparatus for a physical phenomenon by photoexcitation, in particular a delay time modulated and time-resolved, scanning probe microscope apparatus providing an ultimate resolution both temporal and spatial. The apparatus comprises an ultrashort laser pulse generator (2); a delay time modulating circuit (6) which splits an ultrashort laser pulse (3) produced by the ultrashort laser pulse generator (2) into two and which also modulates a delay time tdbetween the two ultrashort laser pulses (4and5) with a frequency (ω); a scanning probe microscope (7); and a lock-in detection unit (8) which performs lock-in detection with the delay time modulation frequency (ω) of a probe signal (11) from the scanning probe microscope (7). It can detect the delay time dependency of the probe signal (11) as its differential coefficient to the delay time, with no substantial influence from fluctuations in the intensity of ultrashort laser pulses (3) while preventing the probe apex (19) from thermal expansion and shrinkage by repeated irradiation with ultrashort laser pulses (3). A photoexcited physical phenomenon dependent on a delay time between ultrashort laser pulses can thus be measured at a temporal resolution in the order of femtoseconds and at a spatial resolution in the order of angstroms.
REFERENCES:
patent: 4918309 (1990-04-01), Beha et al.
patent: 4980566 (1990-12-01), Heilweil
patent: 5289455 (1994-02-01), Kuroda et al.
patent: 5375114 (1994-12-01), Hatanaka et al.
patent: 5416327 (1995-05-01), Weiss et al.
patent: 3145329 (2001-01-01), None
patent: 2001-174764 (2001-06-01), None
patent: 3200263 (2001-06-01), None
V. Gerstner et al.; Journal of Applied Physics, vol. 88, No. 8, pp. 4851-4859. Oct. 15, 2000. Cited in the PCT search report.
Hidemi Shigekawa; Journal of the Surface Science Society of Japan, vol. 20, No. 5, pp. 336-343. May 10, 1999. Cited in the PCT search report.
G. Gerber et al.; Springer Series in Chemical Physics, vol. 60, No. 8, pp. 149-151. 1994. Cited in the PCT search report.
U. Keller; Ultrashort Time Optics: An Overview, NATO ASI Series E., vol. 300, pp. 295-305. 1995. Cited in the PCT search report.
W. Pfeiffer et al.; Applied Physics B., vol. 64, No. 2, pp. 265-268. 1997. Cited in the PCT search report.
Koji Sakaguchi; Heisei 10 Nendo Seika Hokokusho, pp. 197-198. 1999. Cited in the PCT search report.
M. Völcker et al.; Physical Review Letters, vol. 66, No. 13, pp. 1717-1720. Apr. 1, 1991. Cited in the PCT search report.
Osamu Takeuchi et al.; Japan J. Appl. Phys. vol. 41, Part I, No. 7B, pp. 4994-4997. Jul. 2002. Cited in the PCT search report.
Stefan Grafström; Journal of Applied Physics, vol. 91, No. 4, pp. 1717-1753. Feb. 15, 2002. Cited in the PCT search report.
Notification of Transmittal of Copies of Translation of the International Preliminary Examination Report dated Jul. 29, 2004 and received by our foreign associate on Aug. 2, 2004.
Feldstein M. J. et al. “Femtosecond optical spectroscopy and scanning probe microscopy” Journal of Physical Chemistry ACS USA, vol. 100, No. 12, Mar. 21, 1996, pp. 4739-4748, XP002316523.
Anonymous: “Time-Resolved Tunneling Microscope” IBM Technical Disclosure Bulletin, vol. 31, No. 11, Apr. 1, 1989, pp. 350-352, XP002316524.
Morita Ryuji
Shigekawa Hidemi
Takeuchi Osamu
Yamashita Mikio
Japan Science and Technology Agency
Smith II Johnnie L
Wells Nikita
Westerman Hattori Daniels & Adrian LLP
LandOfFree
Delay time modulation femtosecond time-resolved scanning... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Delay time modulation femtosecond time-resolved scanning..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Delay time modulation femtosecond time-resolved scanning... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3693998