Defocus-invariant exposure for regular patterns

Radiation imagery chemistry: process – composition – or product th – Plural exposure steps

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S005000

Reexamination Certificate

active

06991895

ABSTRACT:
For a 2-dimensional periodic array of contact holes or islands, a depth-of-focus-enhancement lithographic scheme based on a combination of alternating phase-shifting mask and off-axis illumination is revealed. The scheme is achieved by choosing appropriate off-axis illumination and smaller numerical aperture such that only two diffraction orders, which are of equal distance from the pupil center, are collected in the first exposure. The image of the 2-dimensional periodic array can be formed by superposing a second exposure on the first. In the second exposure, another appropriate off-axis illumination and smaller numerical aperture is chosen such that another two diffraction orders, which are also of equal distance from the pupil center, are collected.

REFERENCES:
patent: 5424552 (1995-06-01), Tsuji et al.
patent: 5680588 (1997-10-01), Gortych et al.
patent: 5863712 (1999-01-01), Von Bunau et al.
patent: 6057065 (2000-05-01), Rolson
patent: 6064475 (2000-05-01), Chen et al.
patent: 6096457 (2000-08-01), Pierrat
patent: 6453274 (2002-09-01), Kamon
patent: 6492073 (2002-12-01), Lin et al.
patent: 6677088 (2004-01-01), Magome et al.
patent: 6787789 (2004-09-01), Van Der Laan
patent: 6818362 (2004-11-01), Lucas et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Defocus-invariant exposure for regular patterns does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Defocus-invariant exposure for regular patterns, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defocus-invariant exposure for regular patterns will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3583015

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.