Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-04-25
2006-04-25
Lindsay, Jr., Walter L. (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S389000, C438S390000, C438S424000
Reexamination Certificate
active
07033885
ABSTRACT:
Disclosed is a method for manufacturing deep trench structure comprising the steps of providing a substrate; forming a deep trench in the substrate; forming a nitride layer in the deep trench; filling the deep trench with a first conductive layer; removing a portion of the nitride layer not covered by the first conductive layer; refilling the deep trench with another nitride layer so that the sidewall of the deep trench not covered by the first polymer, is covered; partially removing the refilled nitride layer; forming a collar oxide layer in the deep trench; filling the deep trench with a second conductive layer; removing a portion of the collar oxide layer not covered by the second conductive layer; and filling the deep trench with a third conductive layer.
REFERENCES:
patent: 6080618 (2000-06-01), Bergner et al.
patent: 6815307 (2004-11-01), Hsu et al.
patent: 6838334 (2005-01-01), Gluschenkov et al.
patent: 2005/0106831 (2005-05-01), Hsu et al.
Hsu Ping
Wu Kuo-Chien
Bacon & Thomas PLLC
Lindsay Jr. Walter L.
NANYA Technology Corporation
LandOfFree
Deep trench structure manufacturing process does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Deep trench structure manufacturing process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Deep trench structure manufacturing process will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3620224