Semiconductor device manufacturing: process – Making passive device – Trench capacitor
Reexamination Certificate
2008-03-24
2010-06-22
Huynh, Andy (Department: 2818)
Semiconductor device manufacturing: process
Making passive device
Trench capacitor
C438S238000, C438S239000, C438S243000, C438S399000, C438S957000, C257S296000, C257S301000, C257S347000
Reexamination Certificate
active
07741188
ABSTRACT:
A deep trench metal-insulator-metal (MIM) capacitor in an SOI-type substrate. In the deep trench, a layer of TiN, followed by a layer of high-k dielectric, followed by a second layer of TiN. The resulting capacitor is completely buried below the SOI layer, thereby allowing for subsequent structures to be placed over the deep trench.
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Cartier Eduard A.
Chudzik Michael P.
Dyer Thomas W.
Moumen Naim
Abate Joseph P.
Cohn Howard M.
Huynh Andy
International Business Machines - Corporation
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