Debug circuit and a method of debugging

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S704000

Reexamination Certificate

active

07900113

ABSTRACT:
A debug circuit for a multi-mode circuit driven by a clock signal, with an input for a clock signal, and a debug signal generator arranged to generate for each of a subset of the modes of the multi-mode circuit a corresponding debug signal based on a clock signal provided at the input. The frequency of debug signals is dependent on the frequency of a clock signal provided at the input, and each debug signal selects its respective mode for a length of time longer than that of each other mode of the multi-mode circuit, or each debug signal selects its respective mode for a length of time shorter than that of each other mode of the multi-mode circuit.

REFERENCES:
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patent: 5834980 (1998-11-01), Pitio et al.
patent: 6240126 (2001-05-01), Ohashi et al.
patent: 6563888 (2003-05-01), Toriyama
patent: 6806762 (2004-10-01), Stair et al.
patent: 7346821 (2008-03-01), Whetsel
patent: 2003/0067975 (2003-04-01), Yamakura et al.
patent: 2004/0070433 (2004-04-01), Adams et al.
patent: 0 942 533 (2004-04-01), None
patent: WO 01/24008 (2001-04-01), None
patent: WO 2007/132015 (2007-11-01), None

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