Data writing method for mask read only memory

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S290000

Reexamination Certificate

active

07084036

ABSTRACT:
A data writing method for mask read only memory using different doses of ion implantations to perform the data writing of Mask Read Only Memory. A semiconductor substrate having a plurality of gate structures is provided. The different ion implantations are performed depending on the mask from the user, thereby generating the different voltage output values. The different voltage output values are set as (00), (01), (10), and (11) for the bit output. Therefore, the present invention reduces the area of memory required for a specific data record, and lowers the production cost.

REFERENCES:
patent: 6180463 (2001-01-01), Otsuki
patent: 6184094 (2001-02-01), Goto

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Data writing method for mask read only memory does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Data writing method for mask read only memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Data writing method for mask read only memory will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3631602

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.