Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-07-19
2011-07-19
Gaffin, Jeffrey A (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S030000, C714S744000, C713S500000
Reexamination Certificate
active
07984351
ABSTRACT:
A data transfer device transfers data between two clock domains of a data processing device when the data processing device is in a test mode. The data transfer device receives clock signals associated with each clock domain. To transfer data from a first clock domain to a second clock domain the data transfer device identifies transitions of clock signals associated with each clock domain that are sufficiently remote from each other so that data can deterministically be provided by one clock domain and sampled by the other. This ensures that data can be transferred between the clock domains deterministically even when the phase relationship between the clock signals is indeterminate.
REFERENCES:
patent: 7174473 (2007-02-01), Musumeci et al.
patent: 2001/0033629 (2001-10-01), Ito
Josef Schmid Joachim Knäblein, Advanced Ynchronous Scan Test Methodology for Multi Clock Domain ASIC, Aug. 6, 2002.
Osborn Michael J.
Owen Jonathan M.
Advanced Micro Devices , Inc.
Gaffin Jeffrey A
Merant Guerrier
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