Data processing system external pin connectivity to complex func

Details Data processing system external pin connectivity to complex func Data processing system external pin connectivity to complex func

1998-02-12

2000-11-07

DeCady, Albert

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

714 30, 714733, 714734, G01R 3128

Patent

active

061451045

ABSTRACT:
An integrated circuit containing a data processing system with a number of external peripheral pins utilizes the peripheral pins for both testing the corresponding peripherals and for parallel testing of other complex functions in a MCU. The MCU has a plurality of test modes that can be selected, with different peripheral pins being connected to a test circuit depending on which test mode is selected. This allows testing of peripherals via their corresponding pins, as well as other complex functions without the necessity of having dedicated test pins.

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