Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2006-10-10
2006-10-10
Lamarre, Guy (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S738000
Reexamination Certificate
active
07120841
ABSTRACT:
A data generator for generating test data for a word-oriented semiconductor memory is integrated on a semiconductor chip of the semiconductor memory. The data generator has a shift register.
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Greenberg Laurence A.
Infineon - Technologies AG
Lamarre Guy
Locher Ralph E.
Stemer Werner H.
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