Data generator for generating test data for word-oriented...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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C714S738000

Reexamination Certificate

active

07120841

ABSTRACT:
A data generator for generating test data for a word-oriented semiconductor memory is integrated on a semiconductor chip of the semiconductor memory. The data generator has a shift register.

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patent: 5659551 (1997-08-01), Huott et al.
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patent: 6477676 (2002-11-01), Rhodes et al.
patent: 2002/0194558 (2002-12-01), Wang et al.
patent: 0 366 757 (1990-05-01), None
patent: WO 89/09471 (1989-10-01), None

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