Static information storage and retrieval – Read/write circuit – Precharge
Reexamination Certificate
2011-04-12
2011-04-12
Nguyen, Dang T (Department: 2824)
Static information storage and retrieval
Read/write circuit
Precharge
C365S226000, C365S185200
Reexamination Certificate
active
07924641
ABSTRACT:
Circuits and methods to minimize power required for sensing and precharge of DRAMs have been achieved. A control circuit ensures that during READ operations the duration of sensing of DRAM cell and precharging is kept to a minimum. A test DRAM cell is used to determine the exact time required for data sensing. Furthermore no precharging is performed during WRITE-operations. In case data is changing from “1” to “0” or vice versa data lines are inverted accordingly during WRITE operation.
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Wang Shih-Hsing
Yuan Der-Min
Ackerman Stephen B.
Etron Technology Inc.
Nguyen Dang T
Saile Ackerman LLC
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