Data communication interface with memory access controller

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

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714718, G01R 313185

Patent

active

060853441

ABSTRACT:
A serial scan path communication architecture includes a plurality of circuits (30), some of which may include a memory (36). A memory access controller (38) is included on circuits with a memory (36) such that serial data may be written to and written from the memories without having to repetitively cycle through multiple shift operations.

REFERENCES:
"Test Bus Architecture", IBM Technical Disclosure Bulletin, vol. 32, No. 3A, Aug. 1989, pp. 21-27, Aug. 1989.

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