Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-09-18
2007-09-18
Kerveros, James C (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C324S765010
Reexamination Certificate
active
10992223
ABSTRACT:
A curve tracing method including simultaneously connecting a test IC sample and a reference IC sample to a switchboard; and selectively connecting a scanning voltage output or a sensing input of a curve tracer unit to each of the pins of the test IC sample and the reference IC sample via the pin switches and the IC sockets.
REFERENCES:
patent: 5101150 (1992-03-01), Sullivan et al.
patent: 6791344 (2004-09-01), Cook et al.
patent: 6815972 (2004-11-01), Hsu
patent: 2005/0251715 (2005-11-01), Loh et al.
Tan Kok Tong
Tan Seng Hin
Christie Parker & Hale LLP
Kerveros James C
Systems on Silicon Manufacturing Co. Pte. Ltd.
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