Curing methods for silicon dioxide multi-layers

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

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C438S790000

Reexamination Certificate

active

07825044

ABSTRACT:
Methods of curing a silicon oxide layer on a substrate are provided. The methods may include the processes of providing a semiconductor processing chamber and a substrate and forming an silicon oxide layer filling a portion of a trench on the substrate, the silicon oxide layer including carbon species as a byproduct of formation. The methods also include introducing an acidic vapor into the semiconductor processing chamber, the acidic vapor reacting with the silicon oxide layer to remove the carbon species from the silicon oxide layer. The methods may further include depositing additional silicon oxide over the cured silicon oxide to fill the trench. The methods may also include removing the acidic vapor from the semiconductor processing chamber.

REFERENCES:
patent: 2004/0152342 (2004-08-01), Li et al.
patent: 2004/0180557 (2004-09-01), Park et al.
patent: 2007/0026689 (2007-02-01), Nakata et al.

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