Cube maskless lead open process using chemical mechanical polish

Etching a substrate: processes – Forming or treating electrical conductor article – Forming or treating lead frame or beam lead

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216 16, 216 72, 437208, 437915, 437228, C03C 1500, C03C 2506, C23F 100, B44C 122

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active

056097727

ABSTRACT:
A semi-conductor device having a conductive lead with an exposed tip disposed within a first insulative material, which is in turn disposed between insulated first and second integrated circuit chips is disclosed. The first insulative material is etched to form a recess after which a second insulative material is deposited on the access plane of the chips and within the recess. The tip of the wire lead is then exposed by either a chemical mechanical polish or by a wet etch/develop process.

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Srinivasan Sivaram et al., Planarizing Interlevel Dielectrics by Chemical-Mechanical Polishing, May 1992.
Iqbal Ali et al., Chemical-mechanical polishing of interlayer dielectric: A review.

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