CRT focus mask degaussing arrangement responsive to a breakdown

Details CRT focus mask degaussing arrangement responsive to a breakdown CRT focus mask degaussing arrangement responsive to a breakdown

1996-08-22

1998-03-17

Pascal, Robert

Electric lamp and discharge devices: systems

Cathode ray tube circuits

Pulse storing

361150, 313402, H01J 2907

Patent

active

057290920

ABSTRACT:
A cathode ray tube may utilize a focus mask color-selection structure. The focus mask structure is susceptible to localized, transient short circuit events, or breakdown events. These events may be caused by conductive particulates that become free within the cathode ray tube and provide a short circuit between first and second layers of the focus mask. The breakdown events are undesirable because they may result in cross-strand currents causing mask strand magnetization that can interfere with a video image on the screen of the cathode ray tube. A rapid degaussing operation is initiated during the next subsequent vertical blanking period following detection of the breakdown event.

REFERENCES:
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patent: 4535270 (1985-08-01), Frantz et al.
patent: 4636911 (1987-01-01), Truskalo
patent: 4829214 (1989-05-01), Lendaro
patent: 5475283 (1995-12-01), Yoshida
patent: 5499156 (1996-03-01), Bentley
U.S. Patent Application No. 08/701,610 entitled Breakdown Event Detector, filed on Aug. 22, 1996, in the names of Kuczer et al., attorney docket number RCA 87,969Z.

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