Optics: measuring and testing – Dimension
Reexamination Certificate
2005-09-13
2005-09-13
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Dimension
C359S621000
Reexamination Certificate
active
06943901
ABSTRACT:
A critical dimension measuring instrument includes a light source, a beam-shaping optical system, a condenser having a condenser pupil, a first microlens array arrangement, a first auxiliary optical element having positive refractive power, a second auxiliary optical element having positive refractive power, and a second microlens array arrangement. The first microlens array arrangement, the first auxiliary optical element, the second auxiliary optical element and the second microlens array arrangement are arranged in successive fashion between the beam-shaping optical system and the condenser.
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Cemic Franz
Danner Lambert
Davidson Davidson & Kappel LLC
Leica Microsystems Semiconductor GmbH
Nguyen Sang H.
Toatley , Jr. Gregory J.
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