CPU-based system and method for testing embedded memory

Details CPU-based system and method for testing embedded memory CPU-based system and method for testing embedded memory

2005-03-08

2005-03-08

Baderman, Scott (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S733000

Reexamination Certificate

active

06865694

ABSTRACT:
A CPU-based system10and method for testing embedded memory. The technique employs the on-chip CPU20itself to test the embedded memory24.An assembly code program is loaded into the device under test (DUT)12to test the memories, determine a repair solution, and write out the repair solution and raw failure information to the tester for defect analysis. The test is driven by an external programmable clock that is provided by the tester to allow the DUT12to run up to its maximum input clock rate in order to maximize throughput. The test is not dependent on the pattern rate of the tester.

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