4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Erik J. Marinissen

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Core test control

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Method and apparatus for testing a memory array using...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Method for making a digital circuit testable via scan test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Test access architecture and method of testing a module in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1214991

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