Contour structures to highlight inspection regions

Details Contour structures to highlight inspection regions Contour structures to highlight inspection regions

2004-10-12

2008-08-12

Norris, Jeremy C. (Department: 2841)

Electricity: conductors and insulators

Conduits, cables or conductors

Preformed panel circuit arrangement

C257S525000, C257S786000

Reexamination Certificate

active

07411135

ABSTRACT:
An integrated circuit has a wiring layer below an insulator layer. A pad comprises a conductive material that is on the insulator layer. The pad has a wirebond connection region and a probe pad region. An inspection mark is between the wirebond connection region and the probe pad region. The inspection mark comprises an opening in the insulator layer that is filled with the conductive material. In addition, a contact that is through the insulator layer is adapted to electrically connect the conductor wire in the wiring layer to the pad. The contact is formed of the same conductive material used for the pad and the inspection mark.

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