Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2009-07-29
2010-10-26
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C257S048000
Reexamination Certificate
active
07823038
ABSTRACT:
Special test circuitry in an IC for wafer level testing selectively connects the specialized test circuitry to the functional circuitry during wafer test. Following wafer test the special test circuitry is electrically isolated from the functional circuitry and power supplies such that it does not load functional circuit signals nor consume power.
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Antley Richard L.
Whetsel Lee D.
Bassuk Lawrence J.
Brady W. James
Britt Cynthia
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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