Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2003-06-12
2008-08-26
Schillinger, Laura M (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S259000
Reexamination Certificate
active
07416939
ABSTRACT:
A method for manufacturing on a substrate (24) a semiconductor device with improved floating-gate to control-gate coupling ratio is described. The method comprises the steps of first forming an isolation zone (22) in the substrate (24), thereafter forming the floating gate (28) on the substrate (24), thereafter extending the floating gate (28) using polysilicon spacers (40), and thereafter forming the control gate (44) over the floating gate (28) and the polysilicon spacers (40). Such a semiconductor device may be used in flash memory cells or EEPROMs.
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Dormans Guido Jozef Maria
Guelen Josephus Franciscus Antonius Maria
Hendriks Antonius Maria Petrus Johannes
NXP B.V.
Schillinger Laura M
Zawilski Peter
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