Concurrently programmable dynamic memory built-in self-test...

Details Concurrently programmable dynamic memory built-in self-test... Concurrently programmable dynamic memory built-in self-test...

2006-06-13

2006-06-13

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000, C714S031000

Reexamination Certificate

active

07062694

ABSTRACT:
Disclosed are novel methods and apparatus for efficiently providing concurrently programmable dynamic memory built-in self-testing (BIST). In an embodiment of the present invention, a method of utilizing a BIST system is disclosed. The method includes: loading setup data into a configuration register; loading a first instruction into a shift register; loading the first instruction into an update register; executing the loaded first instruction to perform a memory test; upon receiving a first update command, loading a second instruction into the shift register; and upon receiving a second update command, loading the second instruction into the update register.

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