Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface
Patent
1998-07-02
2000-04-25
Baxter, Janet
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Forming nonplanar surface
430325, 430328, 4302701, G03C 556, G03C 176
Patent
active
060542543
ABSTRACT:
A method of forming a pattern which comprises the steps of forming an underlying film on a work film, forming a resist film on the underlying film, exposing the underlying film and the resist film to a patterning exposure light, and developing predetermined regions thus exposed of the resist film and the underlying film with a developing solution. The underlying film has a property that the solubility thereof to the developing solution can be changed by an action of an acid. The resist film and/or the underlying film contains a compound which is capable of generating the acid.
REFERENCES:
patent: 4863827 (1989-09-01), Jain et al.
patent: 5580702 (1996-12-01), Hayase et al.
patent: 5731126 (1998-03-01), Takemura et al.
patent: 5783361 (1998-07-01), Conley et al.
patent: 5795701 (1998-08-01), Conley et al.
patent: 5851738 (1998-12-01), Thackeray et al.
J. Sturtevant et al., "Removable Organic Antireflection Coating", SPIE, vol. 2724, pp. 738-746 (1996).
Onishi Yasunobu
Sato Yasuhiko
Baxter Janet
Clarke Yvette M
Kabushiki Kaisha Toshiba
LandOfFree
Composition for underlying film and method of forming a pattern does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Composition for underlying film and method of forming a pattern , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Composition for underlying film and method of forming a pattern will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-991963