Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate
2007-07-17
2007-07-17
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By polarized light examination
Of surface reflection
Reexamination Certificate
active
11284213
ABSTRACT:
Low aberration relay systems modified to perform as spatial filters in rotating compensator ellipsometer, polarimeter and the like systems.
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WO 01/90687 A2, Thermawave.
WO 01/086257.
J.A. Woollam Co. Flyer on VUV-VASE.
Green Steven E.
Hale Jeffrey S.
He Ping
Herzinger Craig M.
Johs Blaine D.
Akanbi Isiaka O.
Chowdhury Tarifur
J. A. Woollam Co. Inc.
Welch James D.
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