Static information storage and retrieval – Read/write circuit – Bad bit
Patent
1995-08-24
1997-04-15
Nelms, David C.
Static information storage and retrieval
Read/write circuit
Bad bit
3652257, 36523006, 365 96, G11C 700, G11C 800, G11C 1700
Patent
active
056216912
ABSTRACT:
A column redundancy circuit and method of a semiconductor memory device. The column redundancy circuit comprises a programming element for programming a repair column address; a comparing element for comparing the programmed repair column address with a column address inputted from outside to thereby generate a redundancy enable control signal according to result of the comparison; a decoding element for decoding the repair column address signal to thereby generate a decoding signal; and a redundancy column select element for compounding the decoding signal and a data input signal to thereby enable a redundancy column select signal.
REFERENCES:
patent: 4829480 (1989-05-01), Seo
patent: 5297085 (1994-03-01), Choi et al.
patent: 5325334 (1994-06-01), Roh et al.
Nelms David C.
Phan Trong Quang
Samsung Electronics Co,. Ltd.
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