CMOS SiGe channel pFET and Si channel nFET devices with...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S478000, C257S204000, C257S351000, C257S371000, C257S388000, C257S412000, C257SE27062

Reexamination Certificate

active

08053301

ABSTRACT:
Silicon germanium (SiGe) is epitaxially grown on a silicon channel above nFET and pFET regions of a substrate. SiGe is removed above the nFET regions. A device includes a silicon channel above the nFET regions and a SiGe channel above the pFET regions.

REFERENCES:
patent: 7364832 (2008-04-01), Sun et al.
patent: 7838908 (2010-11-01), Kwon et al.
patent: 2001/0015922 (2001-08-01), Ponomarev
patent: 2003/0219938 (2003-11-01), Rhee et al.
patent: 2006/0258073 (2006-11-01), Greene et al.
patent: 2007/0161248 (2007-07-01), Christenson et al.
patent: 2008/0203498 (2008-08-01), Takayanagi
patent: 2009/0191711 (2009-07-01), Rui et al.

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