Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2005-06-21
2005-06-21
Dinh, Son T. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S063000
Reexamination Certificate
active
06909645
ABSTRACT:
In some embodiments, a cluster redundancy scheme may be implemented. Such a scheme may provide cluster segments including rows and columns of replacement memory elements to selectively replace defective elements arranged in rows, columns, or blocks in a main memory array of a semiconductor memory.
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Dinh Son T.
Intel Corporation
Trop Pruner & Hu P.C.
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