Clock skew verification methodology for grid-based design

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

active

06941532

ABSTRACT:
A method and apparatus for determining clock insertion delays for a microprocessor design having a grid-based clock distribution. The method includes partitioning the complete clock net into a global clock net and a plurality of local clock nets, simulating a load for each of the local clock nets, simulating the global clock net, and combining the simulations to form the complete clock net. The method may further include evaluating the combination to determine whether the results converge and storing the simulation results in a Clock Data Model. When the results do not converge, the method re-simulates at least one of the local clock nets and re-simulates the global clock net. The Clock Data Model collects, manages, retrieves, and queries all of the simulation information. The method may further analyze the complete clock net to predict the clock skew for a given data transfer path for potential redesign.

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