Semiconductor device manufacturing: process – Radiation or energy treatment modifying properties of...
Reexamination Certificate
2011-03-08
2011-03-08
Roman, Angel (Department: 2812)
Semiconductor device manufacturing: process
Radiation or energy treatment modifying properties of...
C438S455000, C438S458000, C257SE21001, C257SE21328
Reexamination Certificate
active
07902091
ABSTRACT:
An improved process of substrate cleaving and a device to perform the cleaving are disclosed. In the traditional cleaving process, a layer of microbubbles is created within a substrate through the implantation of ions of a gaseous species, such as hydrogen or helium. The size and spatial distribution of these microbubbles is enhanced through the use of ultrasound energy. The ultrasound energy causes smaller microbubbles to join together and also reduces the straggle. An ultrasonic transducer is acoustically linked with the substrate to facilitate these effects. In some embodiments, the ultrasonic transducer is in communication with the platen, such that ultrasound energy can be applied during ion implantation and/or immediately thereafter. In other embodiments, the ultrasonic energy is applied to the substrate during a subsequent process, such as an anneal.
REFERENCES:
patent: 5374564 (1994-12-01), Bruel
patent: 5670391 (1997-09-01), Lim et al.
patent: 5972782 (1999-10-01), Ostapenko
patent: 6162705 (2000-12-01), Henley et al.
patent: 6225192 (2001-05-01), Aspar et al.
patent: 6358823 (2002-03-01), Krueger et al.
patent: 6387829 (2002-05-01), Usenko et al.
patent: 6413789 (2002-07-01), Ostapenko
patent: 6429104 (2002-08-01), Auberton-Herve
patent: 6458672 (2002-10-01), Henley et al.
patent: 2002/0106870 (2002-08-01), Henley et al.
patent: 2005/0059226 (2005-03-01), Rouh et al.
patent: 2009/0057791 (2009-03-01), Akiyama et al.
patent: 2009/0181492 (2009-07-01), Nunan et al.
patent: 402056928 (1990-02-01), None
Treatment of semiconductor wafer, Iwamatsu Seiichi, English Abstract of JP 402056928 A, Feb. 26, 1990.
Buyanova et al., Ultrasound Regeneration of EL2 Centres in GaAs, Semicond. Sci. Tech. 1994, pp. 158-162, vol. 9 (UK).
Romanyuk et al., Influence of in Situ Ultrasound Treatment During Ion Implantation on Formation of Silver Nanoparticles in Silica, J. of App. Physics, 2006, 99, 034314 1-4 (Melville, NY).
Kruger et al., Influence of In Situ Ultrasound Treatment During Ion Implantation on Amorphization and Junction Formation in Silicon, J. Vac. Sci. Tech. B, Jul./Aug. 2002, pp. 1448-1451, vol. 20(4) (Research Triangle Park, NC).
Ostapenko et al., Change of Minority Carrier Diffusion Length in Polycrystalline Silicon by Ultrasound Treatment, Semicond. Sci. Tech. 1995, pp. 1494-1500, vol. 10 (UK).
Romanyuk et al., Modification of the Si Amorphization Process by In Situ Ultrasonic Treatment During Ion Implantation, Semicond. Sci. Tech. 2001, pp. 397-401, vol. 16 (UK).
Roman Angel
Varian Semiconductor Equipment Associates Inc.
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