Static information storage and retrieval – Read/write circuit – Testing
Patent
1998-11-25
2000-07-04
Elms, Richard
Static information storage and retrieval
Read/write circuit
Testing
36523006, G11C 700
Patent
active
060848081
ABSTRACT:
External address signals are applied to an integrated circuit in a burn-in test mode. The external address signals control the voltage levels of adjacent main word lines in a memory array in the integrated circuit. The adjacent main word lines may thereby be configured in to be in opposing logic states. The opposing logic states may provide a potential difference between the adjacent main word lines, thereby increasing the likelihood of detecting microbridges between the adjacent main word lines formed during fabrication of the integrated circuit. The reliability of the integrated circuit may thereby be improved.
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Kang Sang-seok
Lee Jin-seok
Lim Jong-hyoung
Ryu Byung-Il
Elms Richard
Phung Anh
Samsung Electronics Co,. Ltd.
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