Circuits and methods for analyzing timing characteristics of...

Details Circuits and methods for analyzing timing characteristics of... Circuits and methods for analyzing timing characteristics of...

2006-03-28

2006-03-28

Thompson, A. M. (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07020862

ABSTRACT:
Described are systems and methods for quickly and accurately determining the set-up and hold-time requirements and clock-to-out delays associated with sequential logic elements on programmable logic devices. Programmable interconnect resources are configured to deliver signals to the data and clock terminals of each logic element under test. One or more variable delay circuits precisely place edges of the test signals on the elements of interest while a tester monitors the data clocked into the logic element to determine whether the logic element functions properly. This process is repeated for a number of selected delays.

REFERENCES:
patent: 5815016 (1998-09-01), Erickson
patent: 6008666 (1999-12-01), Conn
patent: 6150863 (2000-11-01), Conn et al.
patent: 6191613 (2001-02-01), Schultz et al.
patent: 6233205 (2001-05-01), Wells et al.
patent: 6239611 (2001-05-01), Matera
patent: 6298465 (2001-10-01), Klotchkov
patent: 6421801 (2002-07-01), Maddux et al.
patent: 6446249 (2002-09-01), Wang et al.
patent: 6657456 (2003-12-01), Jefferson et al.
patent: 6734703 (2004-05-01), Alfke et al.
patent: 6801969 (2004-10-01), Crafts et al.
patent: 6864715 (2005-03-01), Bauer et al.
patent: 2003/0046598 (2003-03-01), Crafts et al.
patent: 2005/0068082 (2005-03-01), Nguyen et al.

Affiliated with

Also associated with

Rating

Circuits and methods for analyzing timing characteristics of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Circuits and methods for analyzing timing characteristics of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuits and methods for analyzing timing characteristics of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3597342