Static information storage and retrieval – Read/write circuit – Precharge
Reexamination Certificate
2011-05-24
2011-05-24
Ho, Hoai V (Department: 2827)
Static information storage and retrieval
Read/write circuit
Precharge
C365S185250
Reexamination Certificate
active
07948820
ABSTRACT:
Commonly, read times of a memory line are slowed due to voltage overshoot and/or voltage undershoot. To eliminate these problems, a control component can manage voltage while a leakage component manages timing of voltage. This allows for a line pre-charge that produces increase read times. The control component can implement as a variable resistor that modifies value to compensate for temperature. The leakage component can include a capacitor configuration that allows voltage to pass.
REFERENCES:
patent: 2008/0175062 (2008-07-01), Tran
Wu Yonggang
Yang Nian
Yang Tien-Chun
Hidalgo Fernando N
Ho Hoai V
Spansion LLC
Turocy & Watson LLP
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