Circuit for testing reliability of chip and semiconductor memory

Details Circuit for testing reliability of chip and semiconductor memory Circuit for testing reliability of chip and semiconductor memory

1994-12-30

1997-11-04

Nelms, David C.

Static information storage and retrieval

Read/write circuit

Testing

371 211, G11C 700

Patent

active

056847483

ABSTRACT:
A test circuit shortens test time during testing reliability of a chip. The test circuit comprises a bit line level sensing circuit connected to a bit line and transferring data in response to a voltage level of the data when a memory cell data is transferred to the bit line, a bit line level sensing control circuit for controlling a driving operation of the bit line level sensing circuit, and transfer device for transferring the data transferred from the bit line level sensing circuit to an outside of the chip, so that the test circuit tests whether the memory cell is defective or not.

REFERENCES:
patent: 5321659 (1994-06-01), Taguchi
patent: 5337270 (1994-08-01), Kawata et al.
patent: 5488583 (1996-01-01), Ong et al.

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