Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-26
2009-11-10
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07617466
ABSTRACT:
A hazard check method and device for making hazard checks of logic circuits containing asynchronous paths and multi-cycle paths. The hazard check device includes a means for equivalent conversion to only pre-embedded conjunctive normal form blocks if not all of the blocks in the logic circuit were embedded conjunctive normal form blocks; a means for tracing each termination point recorded in the signal information from the logic circuit, inputting the signal information to the circuit up to the flip-flop, and assigning numerals to each net; and a means for tracing each termination point recorded in the signal information from the logic circuit, referring to the logic library for each block, and searching for the same logic conjunctive normal form (CNF) as in the logic library, and substituting the conjunctive normal form into the numerals assigned to the connected network, and outputting it as the circuit conjunctive normal form; and a means for adding a circuit conjunctive normal form whose logic is equivalent to that numeral, to each net for each termination point recorded in the signal information.
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Foley & Lardner LLP
NEC Corporation
Siek Vuthe
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