Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-02-14
2006-02-14
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S073100, C714S724000, C714S726000
Reexamination Certificate
active
06998866
ABSTRACT:
A circuit and a method for monitoring defects in an integrated circuit chip. The circuit including a defect monitor portion and a sense element portion, the defect monitor portion either coupled to inputs of sense elements arranged in a chain or coupled between sense elements and forming portions of the chain.
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Edirisooriya et al., Scan Chain Fault Diagnosis With Fault Dictionaries, 0-7803-2570-2/95 IEEE, pp. 1912-1915.
Edirisooriya et al., Diagnosis of Scan Path Failures, 0-818S6-7000-2/95, pp. 250-255.
Bazan Greg
Cohn John M.
Grady Matthew S.
Nigh Phillip J.
Pastel Leah M. P.
Schmeiser Olsen & Watts
Tang Minh N.
Walsh Robert A.
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