4. Radiation imagery chemistry: process, composition, or product th
  5. Including control feature responsive to a test or measurement

Matthew S. Grady

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Circuit and method for monitoring defects

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Designing scan chains with specific parameter sensitivities...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Method of adding fabrication monitors to integrated circuit...

Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement
Reexamination Certificate

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Method of adding fabrication monitors to integrated circuit...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method of adding fabrication monitors to integrated circuit...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2384421

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